substructure imaging of heterogeneous nanomaterials with enhanced refractive index contrast by using a functionalized tip in photoinduced force microscopy - film packaging material
Mechanical Response from light
Luminous nano-materials have been developed at many cutting points
Basic Imaging applications used to characterize various heterogeneous nano structures.
There are two sources for such forces: thermal expansion and induction poles.
Thermal expansion reflects the absorption of the material, which enables people to perform chemical representation of the material when absorbing resonance.
Induced Bipolar interactions reflect the local refractive index of the material below the tip, which helps to characterize materials in the spectral region that do not absorb resonance, such as infrared (IR)-Inactive area.
Unfortunately, the electrical intensity is relatively small, and for most organic and biological materials, the contrast is rarely identifiable, which only shows a slight difference in the refractive index of their components.
In this letter, we demonstrate that the contrast of the refractive index can be greatly enhanced with the help of the functional tip.
With enhanced contrast, we can visualize sub-structures of heterogeneous biological materials such as pan-
Nano Cellulose (PAN-NCC)nanofiber.
From the perspective of sub-structure visualization, we solve the problem of tensile strength of PAN-
NCC fibers manufactured by several different mixing methods.
Our understanding of current research will open up new opportunities for substructural mapping of nano-materials and local field mapping of photon devices (such as surface polarizers on semiconductors) for enhanced sensitivity, metal and van der Waals.
Representation and visualization of heterogeneous components of various nano-materials and their nano-morphology are important components of various disciplines in the field of nano-science and nano-technology.
The optical response indicates the non-uniform composition of the material because the complex refraction index corresponds directly to the electron/vibration mode.
Traditional optical microscopy and spectrum technology is a powerful tool that can detect the combination of optical properties of heterogeneous materials.
However, the spatial resolution of traditional optical microscopy is limited by optical diffraction to half-wavelength, which is equivalent to several hundred nanometers to microns in the visible to infrared spectrum.
In addition, due to the ensemble averaging in the large sample volume, the spectrum is affected by the widening of the non-uniform line. The scan-
Probe technology, including optical proximity
Field microscope is one of the popular techniques used to overcome the diffraction limit.
Field Optical microscope (s-SNOM)
A good example.
However, the actual proximity of isolation-
Field response, which requires complex background suppression methods, often leads to signal degradation.
An alternative nano-optical method combined with a scanning probe microscope is optical
Mechanical force microscope such as light induction force microscope (PiFM), photothermal-
Induced resonance (PTIR)
Technology and peakForce infrared (PFIR)
Microscope, which uses the mechanical force applied to the tip through lightinduced tip-
Example interaction as Readout mechanism. The light-
The sensing forces in these technologies are positioned within the tip radius, enabling direct optical imaging of samples at high spatial resolution.
In these microscopic techniques, the PiFM can operate in a non-contact/tapping mode to monitor the induced electrical intensity based on the dispersed refractive index and the thermal expansion force based on diffuse absorption.
In the case of absorption resonance of non-uniform materials, heat contributes to the chemical representation of the material, while inductive electricity can strongly imaging the local effective exponential distribution associated with the structure of the sample.
Cutting-edge quality plays a vital role in the use of cutting-edge successful Imaging
A scanning probe-based microscope including the PiFM.
Unfortunately, it is well known that most of the commercial tips are contaminated with foreign materials in the manufacturing process.
The main pollutant is polydione (PDMS)
, Also known as silicone, is extracted from silicone oil used to transport and package materials in commercial boxes. The lower-molecular-
The weight form of this silicone polymer evaporates in the packing box, and finally coating the cantilever into a film uniform film for a long packaging time (>800u2009h).
This contamination layer is negligible in most imaging applications because the thickness is expected to be very thin. e. , 1–2u2009nm.
However, since the film has a relatively high thermal expansion rate (907u2009×u200910u2009K)
High extinction coefficient (~u20090. 35 u2009m)in the mid-
The infrared range, although its thickness is small and it is only a few nm, one may expect that the pollutant itself can produce force through thermal expansion by absorbing an enhanced field near the tip of the tip.
Therefore, pollutant molecules can be used as sensitive sensors at the tip.
Enhanced field, which enables one to explore the substructure of the component material, since the field depends on the effective refraction index of the sample system.
In this letter, we first present unprecedented experimental evidence that a small amount of silicone rubber contaminants can produce light-induced force profiles with high sensitivity.
Next, we demonstrate that silicone rubber contamination, considered natural and functional, can be used as a very sensitive sensor to enhance the contrast of local refractive index to visualize the sub-structure of heterogeneous nano-materials
Biological materials in the PiFM nano mirror.
Finally, sub-structures of heterogeneous samples of samples, such as pan-
Nano Cellulose (PAN-NCC)
The nano-fibers show a slight difference in the refractive index of non-uniform components, and we solve the PAN-
NCC fibers made using several different mixing methods.